Focussed Ion Beam (FIB) Combined Scanning Electron Microscope (SEM)
| Information | Detail |
|---|---|
| Type | Focussed Ion Beam (FIB) Combined Scanning Electron Microscope (SEM) |
| Manufacturer | FEI Compnay |
| Model/Specification Number | Quanta 3D FEG |
| Year Manufactured | 2009 |
| Availability | This equipment can be accessed for commercial and research purposes |
| Contact Name | Marc Desmulliez or Mark Leonard |
| Contact email | Jining.Sun@hw.ac.uk or M.Leonard@hw.ac.uk |
| Description |
This scanning electron microscope (SEM) is capable of imaging a variety of specimens at magnifications over 100,000X. The focussed ion beam (FIB) is capable of fast and precise milling of specimen material to create surface features, cross sections and depositions of layers. |
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Heriot-Watt University, School of Engineering & Physical Sciences, Earl Mountbatten Building, Edinburgh, E14 4AS.
