Focus Ion Beam/Scanning Electron Microscope
Image courtesy of the IfM
| Information | Detail |
|---|---|
| Type | Focussed Ion Beam / Scanning Electron microscope with accessories |
| Manufacturer | Zeiss |
| Model/Specification Number | 1540 XB |
| Year Manufactured | 2008 |
| Availability | This FIB/SEM can be accessed for commercial and research purposes |
| Contact Name | n/a |
| Contact email | CIP-admin@eng.cam.ac.uk |
| Description |
Scanning Electron Microscope down to 1.1nm |
Address:
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Centre for Industrial Photonics,
Institute for Manufacturing,
Department of Engineering,
University of Cambridge,
Alan Reece Building,
17 Charles Babbage Road,
Cambridge,
CB3 0FS
