Hitachi Ion Beam Milling System
| Information | Detail |
|---|---|
| Type | Hitachi Ion Beam Milling System |
| Manufacturer | Hitachi |
| Model/Specification Number | FE3500 |
| Year Manufactured | 2011 |
| Availability | This equipment can be accessed for commercial and research purposes |
| Contact Name | Steven Bagshaw |
| Contact email | Steven.bagshaw@uk-cpi.com |
| Description |
The Hitachi ion beam milling system is a preparation tool to be used in conjunction with the Hitachi scanning electron microscope.
The required feature on a glass or polymer substrate is cut to approximately 1 cm x 1 cm, prepared and loaded. An ion beam is concentrated on a chosen area of the sample where material is milled away, leaving a clean edge for cross-sectional analysis to be carried out on the SEM e.g. for measuring layer thickness. |
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