Hitachi Scanning Electron Microscope (SEM)
| Information | Detail |
|---|---|
| Type | Hitachi Scanning Electron Microscope |
| Manufacturer | Hitachi |
| Model/Specification Number | S3700-N |
| Year Manufactured | 2011 |
| Availability | This SEM can be accessed for commercial and research purposes |
| Contact Name | Steven Bagshaw |
| Contact email | Steven.bagshaw@uk-cpi.com |
| Description |
The Hitachi Scanning Electron Microscope (SEM) utilises an electron beam to create an image by scanning the surface of a substrate under vacuum. The detected electrons provide information regarding the topography and composition of a material in a greyscale image and can be used in conjunction with an on site ion beam mill to provide a cross sectional analysis.
The instrument also has an EDX (energy dispersive x-ray spectroscopy) attachment, allowing atomic compositional analysis of samples. Magnification ranges from 12 x to 50,000 x with a resolution of 50nm on substrate sizes up to 4″ x 4″. |
Address:
«Back
Centre for Process Innovation Limited, NETPark, Sedgefield, TS21 3FG
